纳米粒子对聚酰亚胺薄膜电晕老化形态的影响  

Effects of Nanometric Particles on Degradation Morphology of PI Film under Corona

作　　者：李鸿岩[1] 施杰[2] 姜其斌[1] 刘斌[2] 

机构地区：[1]株洲时代新材料科技股份有限公司,湖南株洲412100 [2]西安交通大学电力设备电气绝缘国家重点实验室,西安710049

出　　处：《绝缘材料》2007年第5期42-44,共3页Insulating Materials

基　　金：国家863项目(2006AA11A178)

摘　　要：为了研究无机纳米氧化物在提高聚合物耐电晕性能方面所起的作用,采用高分辩率光学显微镜比较了聚酰亚胺(PI)薄膜和纳米Al2O3填充聚酰亚胺薄膜在相同条件下的老化形貌,发现纯PI表面老化形态早期为山谷状,随着时间的延长山谷的深度增加,最终形成凹坑;而PI-Al2O3复合薄膜则呈浅凹坑状,随着老化的进行最终发展成浅的由纳米粒子组成的蜂窝状孔洞,且老化速度显著降低。In order to study the effects of nanometric oxide particles on the degradation resistance of polymer, the corona degradation tests were carried out under the same condition to compare the aging morphology between nano-Al2O3 filled with PI film and the pure PI film. High resolution optical mi- croscope was used to observe the degradation pattern of the two samples at different stage. It was found that the surface configuration of pure PI is valley-like at the beginning, and pit is finally formed. While shallow pit is formed at the surface of the nano-Al2O3 filled with PI, and a layer of honeycomb-like residue remains on the surface that retards the degradation progress.

关 键 词：纳米粒子 电晕 老化 聚酰亚胺 薄膜 

分 类 号：TM215.3[一般工业技术—材料科学与工程] TQ323.7[电气工程—电工理论与新技术]