高速半导体激光器超短光脉冲产生及脉宽测试  

HIGHSPEED ULTRASHORT OPTICAL PULSE GENERATION BY SEMICONDUCTOR LASER AND ITS WIDTH MEASUREMENT

作　　者：黄超[1] 倪文俊[1] 赵玉强 张欣玫[1] 李世忱[1] 

机构地区：[1]天津大学精密仪器与光电子工程学院

出　　处：《天津大学学报》1997年第3期343-346,共4页Journal of Tianjin University(Science and Technology)

基　　金：天津市科委二十一世纪青年基金

摘　　要：报道了利用增益开关半导体激光器产生超短光脉冲的实验结果，研制了适合测量半导体激光器超短光脉冲宽度的强度自相关测试系统，测得其脉宽为４０ｐｓ．The experimental result of ultrashort optical pulse generation by gain switched semiconductor laser is reported, and an autocorrelation system for measurement of ultrashort pulse width from semiconductor lasers has been developed. The pulse width is measured as 40 ps.

关 键 词：增益开关 半导体激光器 超短光脉冲 脉宽 测试 

分 类 号：TN248.4[电子电信—物理电子学]