摩擦力显微镜及几种材料的微摩擦特性  

FRICTION FORCE MICROSCOPY AND MICRO-FRICTION CHARACTER OF SOME MATERIALS

作　　者：路新春[1] 王吉会[1] 戴长春[2] 温诗铸[1] 绀野大介 

机构地区：[1]清华大学摩擦学国家重点实验室 [2]中国科学院化学研究所 [3]日本精工电子公司

出　　处：《材料研究学报》1997年第3期259-266,共8页Chinese Journal of Materials Research

基　　金：国家自然科学基金!59575032;清华大学青年教师基金;国防科工委微机理研究专项青年基金

摘　　要：介绍了自制的摩擦力显微镜基本原理、结构及关键技术.该仪器能够同时或分别采集横向力和．法向力信号，进行多种微观力函数的程控采集，例如法向力与信号电流的对应关系，针尖与样品间的粘附力还介绍了uN级载荷定量设定方法等．利用该仪器研究了探针与金膜、光盘之间的接触式滑动的微观摩擦行为对微观接触状态进行了理论分析。A friction force microscope(FFM), which was modified from atomic force microscope(AFM),is introduced in this report. The FFM could be used to collect signal of vertical and lateral force in the same time, to show micro-force function, such as dependence of vertical force on signal current, adhesion force be-tween tip and sample etc., by controlling the motion of the tip. The method to set micro-load of 10-9N scale is also introduced. Micro-friction behavior of gold film and compact data disk was studied using the FFM.A method to calculate friction coefficient is given by analyzing the contact state between the tip and sample theoretically.

关 键 词：摩擦力显微镜 纳米摩擦学 微摩擦行为 显微镜 

分 类 号：TH742[机械工程—光学工程] TH117[机械工程—仪器科学与技术]