化学镀Co-P薄膜的磁性及研究  

A study on magnetic properties and application of electroless Co-P thin films

作　　者：王海成[1] 杜中美[1] 王立锦[1] 于广华[1] 朱逢吾[1] 

机构地区：[1]北京科技大学材料科学与工程学院,北京100083

出　　处：《功能材料》2007年第3期359-361,365,共4页Journal of Functional Materials

基　　金：国家自然科学基金资助项目(50471093)

摘　　要：采用化学镀法制备了Co-P磁记录薄膜。当薄膜厚度为0.3μm时,矫顽力可达4.54×104A/m,剩余磁化强度为0.068T。X射线衍射分析表明,当Co-P薄膜较薄时,薄膜结构中无明显择优取向,晶粒较小,此时矫顽力较高;当厚度增加至3-4μm以上时,结构中择优取向明显,晶粒较大,此时薄膜的矫顽力较低。将其应用于磁旋转编码器的磁鼓记录介质,制成直径Φ40mm的磁鼓,当原始充磁磁极对数为512时,脉冲计数完整,输出信号强,波形稳定。Magnetic Co-P thin films were prepared by electroless deposition. When the thickness of the film was 0.3μm,the coercivity got 4.54 × 10^4 A/m, and the remanent magnetization （Mr） got 0.14T. The XRD patterns indicated that,when the Co-P films were thinner, the prevailing orientation of crystalline grains was not obvious, with smaller grains size and higher coercivity;when the film thickness was beyond 3-4μm,the prevailing orientation was obvious, with larger grains size and lower coercivity. The Co-P film was applied to the magnetic drum, whose diameter was 40mm,and then was recorded 512 magnetic poles. The output signals were perfect, and the output waveforms were steady. The pulses account was integral.

关 键 词：化学镀 磁鼓 Co-P薄膜 磁记录介质 

分 类 号：O484.4[理学—固体物理]