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作 者:金葆康[1,2] 桂学琴[1,2] 张剑荣[3] 张祖训[3]
机构地区:[1]安徽大学化学系 [2]安徽大学现代测试中心 [3]南京大学化学系
出 处:《安徽大学学报(自然科学版)》1997年第2期73-84,共12页Journal of Anhui University(Natural Science Edition)
摘 要:研究微盘电极上中等扫速下,准可逆电化学反应的伏安行为。推导适合于多种电化学技术的一般方程。该方程可用于线性扫描伏安法,循环伏安法,阶梯扫描伏安法以及脉冲伏安法等。运用该方程详细地研究了微盘电极上准可逆。The intermediate diffusion problems at a microdisk electrode for any degree electrochemical reaction are reconsidered. A general expression which can be used for various electrochemical techniques, such as linear sweep voltammetry, cyclic voltammetry, step sweep voltammetry and pulse voltammetry etc, is derived in this paper. We focused our attention on linear sweep voltammetry. Theoretical voltammograms are obtained by numerical calculation for several various values of dimensionless parameters, p,λ, and α, where p=(nFvr 2/RTD) 12 , α is electronics transfer coeficient and λ=k 0r/4D. The properties of voltammogram are discussed in detail, the maxium current, the potential of half maxium current and the E 3/4 -E 1/4 various with α,λ and p are also given.
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