近阈值下He原子的双电子电离实验中出射电子研究  

Correlation of emitted electrons in near threshold double ionization of helium by electron impact

作　　者：曹士娉[1] 马新文[1] A.Dorn M.Dürr J.Ullrich 

机构地区：[1]中国科学院近代物理研究所 [2]Max-Planck-Institute for Nuclear Physics,Saupfercheckweg 1,Heidelberg 69117,Germany

出　　处：《物理学报》2007年第11期6386-6392,共7页Acta Physica Sinica

基　　金：国家自然科学基金(批准号:10674140;10434100)资助的课题.~~

摘　　要：利用适用于低能电子入射的反应显微成像谱仪,对电子入射He原子近阈值下的双电离过程进行了研究,实验测量了反应后3个粒子的全部动量,获得了出射电子间的关联信息.主要介绍近阈值下的双电离实验装置及实验技术,集中分析反应后出射电子的动量能量关系,对描述近阈值双电离的Wannier理论进行了检验,发现在入射电子能量为106eV时,实验结果具有Wannier理论预言的性质.　We have performed an experiment on near threshold double ionization of helium by 106eV electron impact with an improved reaction microscope.In this experiment the momenta of three particles after ionization were measured,and the information on correlation of emitted electrons was obtained.Detailed descriptions of the experimental setup and the methods of reconstruction of electron momentum were given.We focused on the analysis of momentum and energy distributions and the angular correlation of the emitted electrons.The experimental results were compared with Wannier＇s prediction,and it was found that the experimental results showed some characteristic features predicted by Wannier theory.

关 键 词：近阈值He原子的双电离 反应显微成像谱仪 电子入射电离 

分 类 号：O562[理学—原子与分子物理]