基于EBSD技术对NiW合金复合基带表面微取向的分析  

Analysis of micro-orientations on the surface of NiW composite substrates using EBSD technique

作　　者：祝永华[1] 索红莉[1] 赵跃[1] 刘敏[1] 何东[1] 马麟[1] 吉元[1] 周美玲[1] 

机构地区：[1]北京工业大学材料学院,国家教育部功能材料重点实验室,北京100022

出　　处：《功能材料》2007年第A10期3973-3976,共4页Journal of Functional Materials

基　　金：国家重点基础研究发展计划（973计划）资助项目（2006CB601005）;国家教委全国百篇优秀博士论文专项资金资助项目（200331）;北京市自然科学基金资助项目（2072004） 致谢：感谢北京工业大学111人才工程基金项目的大力资助!

摘　　要：采用EBSD技术对大冷轧变形量、再结晶退火后的Ni-W复合基带的表面织构进行了表征，对其晶粒取向信息、晶界特征等信息进行采集和分析。该基带经过冷轧和再结晶退火后，无需抛光，即可获得具有花样质量较高的Ni基复合基带表面的EBSD图像。经Orientation Imaging Microscopy^TM（OIM）4．6软件分析，结果表明该Ni基复合基带表面10°以内立方织构晶粒百分含量为97．9％。In this work, the micro-orientation of the Ni5W surface layer on a NiW composite substrate that was processed by heavy cold roiling and recrystallization annealing, was analyzed by EBSD technique. The data such as misorientation angles, grain boundaries as well as no-cubic components was collected, while the results being calculated by OIM 4.6 software. The high EBSD image quality （IQ） was obtained in the sample surface after cold roiling and an annealing process without polishing. A sharp cube texture was formed on the surface of outer-layer of as-obtained NiW composite substrate. The percentage of the cube texture grains in the composite substrates was reached to 97.9% within a misorientation angle of 10° .

关 键 词：EBSD 复合基带 立方织构 

分 类 号：TM26[一般工业技术—材料科学与工程]