Windows 3.1透射电镜样品位向的计算机分析  

Computer Simulation of Orientation of TEM Specimens under Windows 3.1 Environment

作　　者：王裕文[1] 

机构地区：[1]华东冶金学院

出　　处：《钢铁研究学报》1997年第4期52-55,共4页Journal of Iron and Steel Research

基　　金：冶金部资助项目

摘　　要：根据能任意旋转的极射赤面投影的原理，当透射电镜样品需要从一个［ｕｖｗ］方向转到另一个方向时，样品可能倾转的方向、样品台倾转角、膜面旋转参数和面状特征迹线转角将被显示出来。同时，转动后的样品位向亦被确定和显示。According to the principle of the stereographic projection that may be rotated with any method and any angle, the possible tilting orientation of specimen, the tilting or rotating angle of specimen holder, film rotating parameter and trace rotating angle are given when the specimen is tilted from one to another. In the meantime, the orientation of specimen after tilt has been identified and display.

关 键 词：样品双倾台 极射赤面投影 WINDOWS 样品位向 

分 类 号：TP399[自动化与计算机技术—计算机应用技术] O766.1[自动化与计算机技术—计算机科学与技术]