利用 CCD 测定 X 射线增感屏的调制传递函数  

Modulation Transfer Function Measurement for X-ray Film and Luminescent Screen Using CCD and Image Processing System

作　　者：王桂英[1] 黄柳红[1] 沈建国[1] 曹厚德[2] 

机构地区：[1]中国科学院上海光学精密机械研究所 [2]上海市静安区中心医院

出　　处：《计量学报》1997年第3期187-191,共5页Acta Metrologica Sinica

摘　　要：本文论证了利用ＣＣＤ测定Ｘ射线胶片和增感屏调制传递函数的可行性，并给出了一种适用于ＣＣＤ测试数据的处理方法。对于同一种Ｘ射线胶片和增感屏，分别给出了测微光密度计和ＣＣＤ两种测量数据及其误差分析，并且对几种不同的增感屏和胶片性能做了评价。从实际应用中指出利用ＣＣＤ探头测量调制传递函数的优越性。It is feasible that to use CCD device and image processing system in measurement of the modulation transfer function (MTF) of X-ray film and luminescent screen. A method for processing data captured by CCD is given also. At the same time, the data measured by CCD and APD respectively and their errors are given. For a few kinds of luminescent screens and film, the comparison and evaluation are completed. From the practice of MTF measurement, the advantages of using CCD have been given.

关 键 词：X射线 增感屏 CCD探测 APD探测 调制传递函数 

分 类 号：TN622.09[电子电信—电路与系统] R814[医药卫生—影像医学与核医学]