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出 处:《Optoelectronics Letters》2007年第6期462-465,共4页光电子快报(英文版)
基 金:the National Basic Research Program(973) of China (2004CB719805);Doctor Foundation of Ningbo Universiey
摘 要:Electromagnetic fields at the surface of a chiral negative refraction medium (the chirality parameter is larger than the refractive index) are analyzed theoretically. For obtaining chirality parameter,the normalized reflected and transmitted powers as a function of the incident angle are given for the perpendicular (TE) and parallel (TM) polarized incident wave. Brewster angle and total internal reflection angle are discussed. Due to the negative refraction of one eigen-wave in the chiral medium, the reflection, transmission and Brewster angle characteristics are very different from those in the normal chiral medium.Electromagnetic fields at the surface of a chiral negative refraction medium (the chirality parameter is larger than the refractive index) are analyzed theoretically. For obtaining chirality parameter,the normalized reflected and transmitted powers as a function of the incident angle are given for the perpendicular (TE) and parallel (TM) polarized incident wave. Brewster angle and total internal reflection angle are discussed. Due to the negative refraction of one eigen-wave in the chiral medium, the reflection, transmission and Brewster angle characteristics are very different from those in the normal chiral medium.
分 类 号:TB383[一般工业技术—材料科学与工程]
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