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机构地区:[1]北京理工大学材料科学与工程学院,北京100081
出 处:《稀有金属材料与工程》2007年第A03期515-518,共4页Rare Metal Materials and Engineering
基 金:"973计划"资助项目(513180301)。
摘 要:在室温至1000℃范围内,采用谐振腔法测试SiO_2陶瓷复合材料介电性能随频率、温度的变化规律,根据电介质理论,并结合材料本身的成分及结构特征,讨论了SiO_2陶瓷复合材料介电性能变化的物理本质。利用高温XRD分析了SiO_2复合材料从室温至1500℃之间的相组成变化,推测出SiO_2复合材料介电性能受相变影响的温度为1500℃。Influence of the test frequency, temperature and phase transition on the dielectric properties of SiO2 composite materials was investigated. The dielectric constant and loss tangent were measured by high Q-cavity method at the frequency of X-band with the temperature range of 25℃-1000℃ in the nitrogen atmosphere. Based on the componential and structural characteristics of the actual materials, the physical reason in essence for the variation of the dielectric properties was discussed according to the dielectric theory. The temperature influence the dielectric property of SiO2 composite materials was speculated to be 1500℃ based on the results of the XRD analysis from the room temperature to 1500℃.
分 类 号:TB33[一般工业技术—材料科学与工程]
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