模拟VLSI电路故障诊断的相关分析法  

A Correlation Analysis Approach Based Fault Diagnosis of Analog VLSI Circuits

作　　者：谢永乐[1] 

机构地区：[1]电子科技大学自动化工程学院,成都610054

出　　处：《Journal of Semiconductors》2007年第12期1999-2005,共7页半导体学报（英文版）

基　　金：国家自然科学基金重大研究计划资助项目(批准号:90407007)~~

摘　　要：为了提高模拟VLSI电路的测试精度,提出了一种基于数字信号处理的模拟VLSI电路测试方法.将测试响应经余弦调制实现的数字滤波器组完成子带滤波,随后对各子带滤波序列进行能量计算和相关分析,实现模拟响应的数字特征提取.对国际标准电路中的19个故障的实验表明:子带滤波序列的能量计算适合诊断硬故障;相关分析既可诊断硬故障,又可诊断软故障.实验还表明该方法对故障的分辨率远高于文献[7].Aimed at improving test accuracy of analog VLSI circuits,an approach based on digital signal processing （DSP） is presented. Sub-band filtering to test response signals is achieved with a filter bank implemented by Cosine modulation. Energy computing and correlation analysis follow sequences acquired from sub-band filtering. Consequently, digital signature extrac- tion to analog response signal is executed. Experiments to 19 faults in an international Benchmark circuit show that energy computation of a sub-band sequence is applicable for diagnosing hard faults, and correlation analysis has high effectiveness for both hard faults and soft faults. It is also shown that the fault resolution of the approach presented in this paper is much higher than the one reported in Ref[7].

关 键 词：模拟电路测试 故障诊断 子带滤波 余弦调制 

分 类 号：TN707[电子电信—电路与系统]