数字系统电平敏感扫描设计研究  

Research of Level Sensitive Scan Design of Digital System

作　　者：王凯[1] 李耕[1] 徐萍[1] 

机构地区：[1]第二炮兵工程学院,陕西西安710025

出　　处：《现代电子技术》2007年第24期200-201,204,共3页Modern Electronics Technique

摘　　要：在复杂电子系统中对数字系统工作的可靠性要求越来越高,因此提高数字系统的可测试性变得尤为重要。要提高数字系统的可测性,就需要设计人员在设计系统的同时考虑到测试的要求,目前常采用的方法是结构设计。电平敏感扫描设计在结构设计中使用较为普遍,针对电平敏感扫描设计法进行了研究。The complex digital systems required to possess higher and higher reliability. So improve testability of such system is becoming exceptionally important. In order to improve testability of digital system, the researcher should consider testability options right from the start of designing the digital system. Now, the typical method are utilizing structural testability design, and the level sensitive scan design are used widely in structural testability design, so it describes and studies the level sensitive scan design technology.

关 键 词：数字系统 可测试设计 电平敏感扫描 电子系统 

分 类 号：TP331.1[自动化与计算机技术—计算机系统结构]