基于折叠集的低功耗测试  

Lower power test scheme based on folding test set

作　　者：祝沈财[1] 蒋翠云[2] 梁华国[1] 叶益群[1] 张念[1] 

机构地区：[1]合肥工业大学计算机与信息学院,合肥230009 [2]合肥工业大学理学院,合肥230009

出　　处：《计算机应用》2007年第12期3119-3121,3125,共4页journal of Computer Applications

基　　金：国家自然科学基金资助项目(90407008;60633060);安徽省自然科学基金资助项目(050420103)

摘　　要：提出了一种利用折叠计数器特点,基于完全测试集的低功耗测试方案。方案先用几个相关性很好的折叠集测试电路中大部分的故障,然后直接翻转扫描单元中的数据得到剩余故障的测试向量。在硬件上,采用一个地址计数器和随机访问扫描(RAS)结构相结合实现了并行的折叠控制。与传统的混合测试模式相比,克服了伪随机测试阶段带来的功耗问题。实验结果表明,该方案能够有效降低测试功耗和测试时间。A full deterministic low power test scheme based on the feature of folding counter was presented. Firstly,several folding test sets were used to detect most of the potential faults and then the data in scan cells was inverted to generate the test patterns for the other faults. An address counter and Random Access Scan （RAS） were combined to implement a parallel folding controller. Compared with the traditional mixed mode test, the test power caused by pseudo-random test patterns was decreased. Experimental result shows that the total test power and test time can be greatly reduced,

关 键 词：编码 低功耗 折叠计数器 折叠种子 

分 类 号：TP391.76[自动化与计算机技术—计算机应用技术]