双电桥测低电阻研究  

The Research of Measuring Low Resistance by Double Arm Bridge

作　　者：徐加勤[1] 曾天海[1] 

机构地区：[1]北京理工大学应用物理系

出　　处：《北京理工大学学报》1997年第4期511-513,共3页Transactions of Beijing Institute of Technology

摘　　要：用双电桥测低电阻，传统的方法是采用电压内接法而排斥电压外接法．通过实验数据、电路分析，得出了用双电桥测低电阻时，无论采用电压接头内接法还是外接法，电阻测量值均不变的结论．Traditionally, measuring low resistance by double arm bridge was made with the voltage jointers being linked inside other than that being linked outside. By dissecting the data of experiment and the circuit, this article infers that when the low resistance is measured by double arm bridge, whether the two voltage jointers are linked inside or outside, the measured value would be the same.

关 键 词：双电桥 低电阻 电压接头 电阻测量 

分 类 号：TM934.1[电气工程—电力电子与电力传动]