单离子束技术概述  

Review of single ion microbeam technology

作　　者：詹福如[1] 许明亮[1] 许永建[1] 余增亮[1] 

机构地区：[1]中国科学院离子束生物工程实验室,合肥230031

出　　处：《强激光与粒子束》2007年第11期1913-1917,共5页High Power Laser and Particle Beams

基　　金：中国科学院创新基金资助课题(KSCX2-SW-324)

摘　　要：对单离子束的发展和应用作了介绍。结合我国首台单离子束装置CAS-LIBB,综合讨论了准直器限流型和静电透镜聚焦型两种典型单离子束的技术结构。限流型结构简单但定位精度有限,聚焦型条件苛刻但可获得亚微米束,是单离子束发展的趋势。评估了前探测、全前置探测和后探测3种单离子束探测方式及其特点,研究了这3种探测方式对辐照离子的计数精度和单离子束品质产生的影响。对CAS-LIBB装置研制了光导型全前置探测器以提高计数精度和束流品质。最后设计了快速荧光在线检测技术方案。Based on the CAS-LIBB facility, the first single ion microbeam of China, this paper discusses the technology and characteristics of two typical single ion microbeam facilities. One is the collimation type which is simpler in structure but lower in precision. The other is electrostatic lens type that is rigorous but with high positioning precision of submicron, which leads the future of single ion microbeam（SIM）. Three detection types, front detection, complete front detection and back detection, are judged, and their effects on the count of radiating ions and the beam quality are studied. A new detector with coupled fiber is being developed for CAS-LIBB microbeam. The fast fluorescence detection with online mode is designed. And finally, the future and the application of SIM are concisely illuminated.

关 键 词：单离子束 束流探测 在线检测 束流品质 

分 类 号：TL99[核科学技术—核技术及应用]