基于输出迭代法的A/D转换器测试数据分析  

Analysis of Test Result of Analog-to-Digital Converter Based on Overlapping of Output Data

作　　者：朱凯[1] 叶凡[1] 陈廷乾[1] 任俊彦[1] 许俊[1] 

机构地区：[1]复旦大学专用集成电路与系统国家重点实验室,上海201203

出　　处：《微电子学》2007年第6期822-825,共4页Microelectronics

基　　金：国家自然科学基金资助项目(90407003)

摘　　要：介绍了一种将模拟/数字转换器(ADC)的采样输出按照正弦输入信号的周期进行迭代的数据处理方法,可以评估输入噪声和时钟抖动对动态性能测试结果的影响。同时,通过分析迭代后的信号波形,可以发现高频输入信号在ADC转换过程中存在的畸变、非单调、失码、跳码、失真等现象,而这些现象很难从输出数据中直接观察到。这种分析对ADC的设计具有重要的指导意义。实验结果表明,这种方法是实用有效的。A method of overlapping output data of analog-to-digital converter （ADC） with the cycle of the input sine wave was described. By processing the data, the influence of input noise and clock jitter on dynamic parameters of ADC can he evaluated. By analyzing the waveform after overlapping, phenomena such as abnormal change, nonmonotonic, missing codes, sparkle codes and distortion etc, can also he observed, which occurred in the process of conversion of ADC with high frequency input signals and were difficult to he found and observed from the output data directly. This kind of analysis is significant to the design of A/D converters. The results of the experiment demonstrated that this method is practical and effective.

关 键 词：模拟/数字转换器 迭代 测试 动态性能 

分 类 号：TN792[电子电信—电路与系统]