球形样件轮廓度工业CT精确测量方法研究  

Accurate Determination of the Profile of the Sphere Samples by industrial CT

作　　者：杨莞[1] 叶云长[1] 孙灵霞[1] 陈发[1] 周江[1] 张爱东[1] 

机构地区：[1]中国工程物理研究院,四川绵阳919信箱71分箱621900

出　　处：《核电子学与探测技术》2007年第5期879-881,共3页Nuclear Electronics & Detection Technology

摘　　要：详细介绍了封闭体内球形样件轮廓度工业CT精确测量方法,在获得球体样件CT断层图像的基础上,利用CT插值方式提取球体样件的轮廓线边界系列CT值,再根据二次曲线逐次逼近拟合法获得其圆心坐标及平均半径,建立了封闭体内球形样件轮廓度及壁厚的工业CT精确测量方法,并编制了专用测量软件用于实际球形样件轮廓度的测量,比较该方法及三坐标法对不同直径、不同壁厚系列球体模拟件测量结果,在95%置信度下,测量精度达到0.05mm。On the foundation of the CT profile chart of sphere samples,the CT value on the borderline of the sample was obtained by interpolation method,and then the coordinate of center and mean radius was acquired through conical successive approximation method.The method for accurate measurement of the profile and wall thickness was founded,and the special purpose software was built.On the degree of 95% confidence level,the precision of survey of 0.01mm for samples of different radius and wall thickness was gained.

关 键 词：球形样件 轮廓度 工业CT 

分 类 号：TB39[一般工业技术—材料科学与工程]