XRF方法在测量纸张厚度中的应用  

THE APPLICATION OF XRF TO THE THICKNESS MEASUREMENT OF PAPER

作　　者：郭伟[1] 赖万昌[1] 郭生良[1] 程峰[1] 

机构地区：[1]成都理工大学核技术与自动化工程学院,成都610059

出　　处：《核电子学与探测技术》2007年第5期958-961,共4页Nuclear Electronics & Detection Technology

基　　金：国家自然科学基金(No.40274048)资助

摘　　要：本文的目的是研究XRF法在纸张厚度测量上的应用。采用X射线荧光吸收法和源初级射线散射法分别对一批纸张样品质量厚度进行测量,并对测量结果进行对比,作出有益的讨论。测量是采用成都微子科技有限公司的IED-2000P型手提式多元素X射线荧光分析仪,探测器选用Si-PIN电致冷半导体探测器,同位素源采用双激发源(238Pu)。实验表明:X射线荧光吸收法在纸张厚度测量上的准确度要比源初级射线散射法好,采用源初级射线散射法对于纸张厚度的测量也是可行的。The purpose of this paper is to study on the application of XRF to the thickness measurement of paper.The mass thickness of a number of paper samples were respectively measured by the X-ray absorption method and the primary rays of radiated sources scattering method.The measurement results had been compared with each other,and got several helpful discussions.The measurement was using the IED-2000P type X-ray fluorescence analyzer from Chengdu Micro-Particle Technology Ltd.,which is composed of a Si-pin X-ray detector with thermo electrical cooler,and double isotope sources（238Pu）.The experiment indicated that the veracity of the X-ray absorption method on the thickness measurement of paper is better than the primary rays of radiated sources scattering method,and the application of the primary rays of radiated sources scattering method to the thickness measurement of paper is verified as feasible.

关 键 词：X射线荧光 纸张 质量厚度 散射射线 

分 类 号：O657.34[理学—分析化学]