扫描光屏法在PIV技术测量自由剪切层中的应用  

The Application of Sweep Light Method in Measurement of Free Shear Layer Using PIV Technique

作　　者：吴嘉[1] 许宏庆[1] 

机构地区：[1]清华大学工程力学系,北京100084

出　　处：《水动力学研究与进展（A辑）》1997年第2期157-163,共7页Chinese Journal of Hydrodynamics

基　　金：国家自然科学基金资助

摘　　要：PIV(Particle Image Velocimetry)技术是九十年代实验流体力学的重大成就.它能够提供瞬时整个流场的定量信息,而且具有很高的空间分辨率和很好的精度.为了获得清晰、可靠的PIV底片,人们对实验方法作了很多改进.本文讨论了近来使用较多的扫描光屏法,提出了该方法在使用中特别注意的一些问题,并给出了用该方法测量自由剪切流场的结果.PIV (Particle Image Velocimetry) technique is a great achievement of experimental fluid mechanics in 1980s. It can provide instantaneous velocity of whole flow field and has high resolving power and high precision. In order to get clear and reliable PIV negative, many experimental methods have been improved. In this paper,we discussed the sweep light method which had been used more frequently. Some problems are raised and clarified. Using the method. ,we measured free shear layer and got some worthy results.

关 键 词：扫描光屏法 自由剪切层 粒子图象测速 流体 

分 类 号：O357.43[理学—流体力学]