空间干扰对电容式套管介质损耗因数(tanδ)测量结果影响的分析  

Analysis on the Effect of Space Disturbance upon Capacitive Bushing Dielectric Loss Factor(tanδ) Measurement

作　　者：苏煜[1] 张燕涛[1] 王薇[1] 

机构地区：[1]西安供电局,陕西西安710032

出　　处：《高压电器》2008年第1期87-87,90,共2页High Voltage Apparatus

摘　　要：空间干扰对现场试验中出现的电容式套管介质损耗因数tanδ可造成影响,使其偏小甚至出现负值。针对这一问题,笔者进行了分析研究,并提出了相应的建议:在现场进行电容性套管的介质损耗测量时,必须认真分析空间干扰网络的影响,以防止介质损耗因数的测量误差,保证测量结果的准确性。An analysis has been made in this paper on the effect of space disturbance upon capacitive bushing dielectric loss factor tanδ measurement, which appears to be smaller value than the normal , sometimes even to be a negative value, in site test. To ensure the veracity, as while as to avoid the measuring error, the effect of space disturbance should be considered necessarily in on-site capacitive bushing dielectric loss measurement.

关 键 词：空间干扰 电容式套管 介质损耗因数 测量 

分 类 号：TM216.5[一般工业技术—材料科学与工程]