KDP晶体光学均匀性检测实验研究  

Measurement of Optical Uniformity of KDP Crystals

作　　者：程晓锋[1] 蒋晓东[1] 郑万国[1] 任寰[1] 袁晓东[1] 袁静[1] 徐旭[1] 张林[1] 贺群[1] 

机构地区：[1]中国工程物理研究院激光聚变研究中心,四川绵阳621900

出　　处：《光电工程》2008年第2期25-28,共4页Opto-Electronic Engineering

基　　金：863高技术项目

摘　　要：本文阐述了正交偏振干涉测量技术的基本原理和实验方法。Fizeau干涉仪的输出激光束经过线偏振镜后变为线偏振光,调整偏振方向让光束的偏振态分别平行于KDP晶体的o轴和e轴,得到两幅干涉图。通过这两幅干涉图的差值得到晶体的折射率分布不均匀性。该检测技术借助可改变输出激光偏振态的大口径干涉仪精确地测量晶体在切割方向上o光折射率和e光折射率的偏差。本文所采取的方法是在大口径干涉仪的小端口放入可改变偏振方向的线偏光镜。本文通过对一批330mm×330mm的大口径KDP晶体的折射率均匀性测量验证了该方法。The basic principle and experimental method of Orthogonal Polarization Interferometry （OPI） were described in this paper. The output laser beam of Fizeau interferometer was polarized by a linear polarizer, and two interferograms were obtained： the polarization orientation of one of them consisting with o-axis of KDP crystals, and the other one polarizing orientation is orthogonal with that o-axis. The non-uniformities of refractive indices of KDP crystals were calculated from difference of those two interferograms, The large aperture interferometer was used to accurately measure the differential distribution of KDP refractive indices. A linear polarizer whose polarizing orientation was changeable was put at the end of small aperture of interferometer. The difference of KDP refractive indices of eight pieces of KDP crystals as large as 330mm × 330mm was obtained by orthogonal polarization interferometry.

关 键 词：正交偏振干涉 KDP晶体 折射率不均匀性 

分 类 号：TN247[电子电信—物理电子学]