Zeeman原子吸收光谱分析法中谱线轮廓的研究(Ⅳ)──Te 214.3 nm和Te 225.9 nm谱线  

Studies on the Spectral Line Profiles in Zeeman Effect Atomic Absorption Spectroscopy (Ⅳ)-Te 214. 3 nm and Te 225.9 nm Lines

作　　者：陈江韩[1] 何志荣[1] 龚惠玲[1] 舒永红[1] 何华焜[1] 

机构地区：[1]中国广州分析测试中心,广州510070

出　　处：《高等学校化学学报》1997年第1期46-48,共3页Chemical Journal of Chinese Universities

摘　　要：The effect of different modulated modes on the analytical performances of Te 214. 3nm and 225. 9 nm in Zeeman AAS has been studied and discussed theoretically and ex-perimentally in this paper, based on the overlapping relationship of AE, AA and ZAA calcu-lated theoretically and plotted line profiles for Te 214. 3 nm and 225. 9 nm. The experimental results are consistent with those in theory.The effect of different modulated modes on the analytical performances of Te 214. 3nm and 225. 9 nm in Zeeman AAS has been studied and discussed theoretically and ex-perimentally in this paper, based on the overlapping relationship of AE, AA and ZAA calcu-lated theoretically and plotted line profiles for Te 214. 3 nm and 225. 9 nm. The experimental results are consistent with those in theory.

关 键 词：谱线轮廓 碲 原子吸收光谱 

分 类 号：O657.31[理学—分析化学]