高直流电场下PET薄膜的电致发光及其可靠性  

Study on the Electroluminescence and Reliability of PET Films under High DC Fields

作　　者：林家齐[1] 杨文龙[1] 王玮[1] 雷清泉[1] 

机构地区：[1]哈尔滨理工大学,黑龙江哈尔滨150080

出　　处：《发光学报》2008年第1期56-60,共5页Chinese Journal of Luminescence

基　　金：国家自然科学基金重点项目(50137010);黑龙江省自然科学基金(E2001-03)资助项目

摘　　要：用自制电致发光（Electroluminescence-EL）测量装置测试了直流高电场下聚对苯二甲酸乙二酯[poly（ethylene terephthalate）-PET]薄膜EL的光强和光谱。实验表明：PET的发光光强随所加电场而增大，在4．00MV／cm附近发生预击穿。EL光谱在300～400nm、400～460nm、500～600nm和680nm附近存在发射峰，其中500～600nm峰带相对较强，预击穿信号出现后680nm附近的峰带增加很快。为了评价PET的介电性能，本文对实验数据用双参数Weibull分布解析法计算，得出了该薄膜在（24±1）℃，阶跃加压条件下的寿命和击穿电场的累积失效概率和可靠度方程，Weibull假设检验结果表明，实验结果服从Weibull分布。The EL intensity and the spectrum of the PET films were tested home-made experimental set-up. The result shows that the light emissio inte along with the electric fields ; the pre-breakdown field is about 4.00 MV/cm under dc high electric nsity of the PET films . The EL spectra have fields by increases emission peaks at 300 -400 nm, 400 -460 nm, 500 -600 nm and 680 nm, the peaks between 500 nm and 600 nm is higher. The peak of 680 nm increases quickly after the pre-breakdown phenomenon appears. In order to value the dielectric character of the PET films, the experimental data were analyzed by the analysis of two-parameter Weibull distribution, the life time, the cumulative failure probability of the breakdown field and the reliability equation were found out under the voltage power increased step by step at （24 ±1 ） ℃. After the verification of assumption, it＇s found that the experimental results submit Weibull distribution.

关 键 词：聚对苯二甲酸乙二酯 电致发光 WEIBULL分布 可靠性 

分 类 号：TN383.1[电子电信—物理电子学] TN873.3