傅里叶分析法求Stokes矢量测量扭曲向列相液晶盒盒厚和扭曲角(英文)  

The Cell Thickness and Twist Angle Measurement of Twist Nematic Liquid Crystal Cell by Rotation of a Quarter-Wave Plate Using Fourier Analysis Method

作　　者：崔宏青[1] 凌志华[1] 

机构地区：[1]中国科学院长春光学精密机械与物理研究所

出　　处：《电子器件》2008年第1期87-91,共5页Chinese Journal of Electron Devices

基　　金：国家“973”资助项目(2003CB314704)

摘　　要：本文提出了一种测量扭曲向列相液晶盒盒厚与扭曲角的新方法,在液晶盒和检偏器之间放置四分之一波片,通过旋转此四分之一波片,测量各个调制点的光强,用傅里叶分析法计算线偏振光穿过液晶盒后的stokes矢量,从而求出液晶盒盒厚以及扭曲角。实验证明,用此方法测量盒厚比较小的液晶盒厚有较高测量精度。另外,此方法也可以应用到单偏振片反射式液晶盒盒厚和扭曲角的测量。Proposed a new method of determining the cell thickness and the twist angle of twisted nematic liquid crystal cells, a quarter-wave plate was inserted between the liquid crystal cell and the analyzer, a stepper motor rotated the Retarder by , and measured the light intensity of every modulated point, solved the stokes parameters of polarization light exiting from the liquid crystal cell using Fourier analysis method, thereby determining the cell thickness and the twist angle. Experiments indicated that it is suitable for measuring the low-cell-gap accurately, in addition, it also can be applied to the measurement of the cell thickness and twist angle of single polarizer reflected liquid crystal cell.

关 键 词：液晶 stokes参量 傅里叶分析法 

分 类 号：TN27[电子电信—物理电子学]