SSRF定时系统硬件温漂性能测试  

Temperature drift of SSRF timing system

作　　者：赵黎颖[1] 殷重先[1] 刘德康[1] 

机构地区：[1]中国科学院上海应用物理研究所,上海201800

出　　处：《核技术》2008年第2期87-89,共3页Nuclear Techniques

摘　　要：介绍一种利用相移检测硬件温漂性能的测试平台,系统阐述了硬件构架并详细推导了软件算法,具有硬件构建简单、软件算法清晰、检测精度高和通用性广等特点。文章给出了利用该平台测试上海同步辐射光源(Shanghai Synchrotron Radiation Facility,SSRF)定时系统硬件温漂性能的结果。A test platform for measuring temperature drift of SSRF timing system has been developed. The hardware and software algorithm of the platform are described in detail in this paper. It is featured by fewer hardware, clear software algorithm, high sensitivity and wide applications for either SSRF systems or other systems with similar temperature drift requirement. Finally, the curve and conclusion of SSRF timing system temperature drift was given.

关 键 词：长期温漂 相位 算法 通用总线接口 定时系统 

分 类 号：TP273.5[自动化与计算机技术—检测技术与自动化装置]