基于概率转移矩阵的电路可靠性并行计算方法  

Parallel Processing of the Probabilistic Transfer Matrix Based Circuits Reliability Calculation

作　　者：王真[1,2] 江建慧[1,2] 沈君华[1,2] 史哲文[1,2] 

机构地区：[1]同济大学嵌入式系统与服务计算教育部重点实验室,上海201804 [2]同济大学计算机科学与技术系,上海201804

出　　处：《小型微型计算机系统》2008年第2期357-360,共4页Journal of Chinese Computer Systems

基　　金：国家科技部“九七三”计划项目(2005CB321604)资助;国家自然科学基金项目(90207021)资助

摘　　要：随着电路集成度的提高,软差错已经成为影响可靠性的关键因素.概率转移矩阵是一种用于估计软差错对电路影响的有效方法,它通过对门级电路建立概率模型来计算电路的可靠性.本文基于概率转移矩阵研究计算电路可靠性的并行方法,提出了一种电路分割算法,在对电路进行划分后,并行地计算各个模块的概率转移矩阵,再合成对应于整个电路的概率转移矩阵.其中,引入了代数决策图压缩矩阵存储空间.初步的实验结果表明,该并行算法可以有效地减少21.46%的平均时间开销.Probabilistic transfer matrix （PTM） is an efficient approach to estimate the effects of soft errors for moderate scale circuits at gate level. This paper researches a parallel method base on PTM and proposes a circuit partition algorithm. The considered gate level circuit is partitioned into modules first,and the probabilistic model for each module is built. Then all of the PTMs of modules are calculated in parallel,and they are combined to get the reliability of the whole circuit. The algebraic decision diagram is employed to compress the matrixes. The primary experimental results show that the decrement of the average time overhead of the parallel method is 21.46%.

关 键 词：转移矩阵 代数决策图 电路分割 

分 类 号：TP331[自动化与计算机技术—计算机系统结构]