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出 处:《Chinese Physics B》2008年第3期921-926,共6页中国物理B(英文版)
基 金:Project supported by the State Key Basic Research Program(Grant No2001CB309307);the National Natural Science Foundation of China(Grant Nos10334050 and 10474105);Key Oriental Project of Chinese Academy of Sciences(Grant No KGCX2-SW-100)
摘 要:This paper observes the parametric excitation on atom chip by measuring the trap loss when applying a parametric modulation. By modulating the current in chip wires, it modulates not only the trap frequency but also the trap position. It shows that the strongest resonance occurs when the modulation frequency equals to the trap frequency. The resonance amplitude increases exponentially with modulation depth. Because the Z-trap is an anharmonic trap, there exists energy selective excitation which would cause parametric cooling. We confirm this effect by observing the temperature of atom cloud dropping.This paper observes the parametric excitation on atom chip by measuring the trap loss when applying a parametric modulation. By modulating the current in chip wires, it modulates not only the trap frequency but also the trap position. It shows that the strongest resonance occurs when the modulation frequency equals to the trap frequency. The resonance amplitude increases exponentially with modulation depth. Because the Z-trap is an anharmonic trap, there exists energy selective excitation which would cause parametric cooling. We confirm this effect by observing the temperature of atom cloud dropping.
关 键 词:atom chip parametric excitation parametric cooling
分 类 号:TN405[电子电信—微电子学与固体电子学]
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