剪切电子散斑干涉仪的实验应用  

Experimental Research on Equipment of Electric Speckle Pattern Interferometry Method

作　　者：曾伟明[1] 朱启荣[1] 章彰[1] 王东方[1] 杨国标[1] 曾伟明 朱启荣[2] 章彰[2] 王东方[2] 杨国标[2] 

机构地区：[1]同济大学航空航天与力学学院,上海 200092 [2]同济大学国家力学实验教学示范中心,上海 200092

出　　处：《现代科学仪器》2008年第1期68-70,共3页Modern Scientific Instruments

基　　金：国家自然科学基金(10672124)。

摘　　要：简要介绍剪切电子散斑干涉的基本原理,将标准试件在受载后的位移和位移梯度干涉条纹,通过CCD摄取并进行处理,从干涉条纹直接获得令人满意的结果,通过实验说明该技术能够应用在各个不同的场合,将成为无损检测的有效方法。The paper present the theory and equipment of Electric Speckle Pattern Interferometry Method. The displacement and the degree of displacement were dealt with by CCD Camera photo and image -processing under typical sample loading, so that good stripes has been gotten and we obtained good results. This paper indicates that the technology of Electric Speckle Pattern Interferometry Method could be used in engineering widely, it is a kind of highly automatic, untouched, highly precision, low environment required equipment, it is also one mainly kind of directions of optical development in the future,

关 键 词：干涉条纹 剪切电子散斑 典型实验 

分 类 号：TH744.3[机械工程—光学工程]