PCS中基线值对累积法反演结果的影响分析  

Analysis on the Effect of Baseline Value on the Inversion Results of Cumulant Method in PCS

作　　者：刘桂强[1] 杨冠玲[1] 周述苍[1] 曾思明[1] 韩鹏[1] 

机构地区：[1]华南师范大学物理与电信工程学院,广州510006

出　　处：《光电工程》2008年第3期88-92,共5页Opto-Electronic Engineering

基　　金：广东省科技计划项目(2003C103019)

摘　　要：针对光强自相关函数与归一化光场自相关函数之间的关系,指出基线值的不同会影响到颗粒粒径和分散度的测量结果。分析了纳米颗粒尺寸和分散度测定的光子相关光谱技术中的累积算法。利用光子相关光谱技术对三种不同材料共五种尺寸的颗粒进行了测试分析,结果显示:测量基线方法不同,对应的基线值会不同,利用累积法反演得到的颗粒粒径和分散度的结果也会不同。从理论上分析了反演结果不同的原因。本文确认了自动斜率法是较恰当的确定基线的方法。According to the relation between intensity Autocorrelation Function （ACF） and normalized light field ACF, the effect of different baseline values on the results measured by using Photon Correlation Spectroscopy （PCS） was presented. The cumulant method which was used to inverse the size and polydispersity of nano-particle in PCS was analyzed. Three types of materials with five different sizes were measured by using PCS and the results showed that when the baseline methods were different, the value of baselines and the results of the effective diameter and polydispersity inversed by cumulant method were different, too. The reason was analyzed theoretically. It is pointed out that the autoslope method of acquiring baseline is the appropriate measured method.

关 键 词：光子相关光谱法 纳米颗粒测量 累积法 有效直径 分散度 

分 类 号：O432.2[机械工程—光学工程]