高压对LDLT5450岩性密度测井仪Pe值刻度的影响  

Effect of High Voltage on Calibration of Pe of LDLT5450 Litho-Density Logging Tool

作　　者：解琪 郭广鎏 郑福荣 骆庆锋 王悦欣[2] 

机构地区：[1]中国石油集团测井有限公司测井仪器厂,陕西西安710061 [2]吉林油田分公司测井公司,吉林松原138000

出　　处：《测井技术》2008年第1期80-82,共3页Well Logging Technology

摘　　要：LDLT5450岩性密度测井仪是EILog-05测井系统中的重要井下仪器之一。用三角形近似伽马能谱分析了光电倍增管高压对岩性窗(LITH)和密度窗(LL、LU)计数影响的差别,得到了Pe测量值会随高压增加而增加的认识。仪器在刻度器上的测量结果验证了此认识,并表明应注意高压对Pe值的刻度参数的影响。LDLT5450 litho-density logging tool is an important tool in EILog-05 well logging system The difference between effects of high voltage of photoelectric multiplier tube to counts in lithological window （LITH） and density window （LL, LU） is analyzed by an approximated triangle gamma energy spectrum, and concluded is that the measurement of Pe will increase following increase of the high voltage. Measurements on the calibrators verify the conclusion, and show that attention should be paid to the effect of high voltage to calibration parameters of Pe.

关 键 词：岩性密度测井仪 高压 光电吸收指数 刻度 

分 类 号：P631.63[天文地球—地质矿产勘探]