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作 者:张秋芳[1] 彭嘉桂[2] 林琼[2] 章明清[2]
机构地区:[1]福建省农业科学院生物技术研究所,福州350003 [2]福建省农业科学院土壤肥料研究所,福州350013
出 处:《土壤》2008年第1期106-109,共4页Soils
基 金:福建省自然科学基金项目(B0010027)资助
摘 要:通过水培试验,用电镜技术研究了不同浓度硫(S)素营养对水稻根系和叶片超微结构的影响。结果表明,受S素营养胁迫的水稻,其根系及叶片的超微结构均发生了显著的变化:低S胁迫会造成水稻叶片叶肉细胞内的叶绿体结构肿胀,基粒片层松驰、散乱,细胞器减少,线粒体结构被破坏,根系细胞内几乎没有内含物;S浓度高则会使叶片叶绿体基粒片层致密、浓缩,无规则化,根系细胞发生质壁分离。这就从微观上进一步解释了水稻S素营养胁迫严重影响其生长发育的原因与机理,也为水稻S素营养的早期诊断提供了解剖学与形态学的依据。Variation of ultrastructures of leaves and roots of rice growing in nutrient solutions different in sulfur concentration was observed by TEM. Results indicated that the variation was significant from treatment to treatment. S-deficiency caused bulging chloroplasts, loosening and dishevelled grana lamella, reducing organelle, and damaged chondriosome in mesophyll cells of the leaves, and empty cells of the roots, while S-excess, however, led to densification, condensation and randomization of grana lamella of the chloroplasts of the leaves, and separation of cytoplasms from walls of the cells of the roots. The findings further explain how S-stress affects growth of rice, and serve as morphological and anatomical bases for diagnose of S nutrition at the early growing stages of rice.
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