边界扫描在带DSP芯片数字电路板测试中的应用  

An Application of Boundary-scan in Testing Digital Circuit Board with DSP Chips

作　　者：曹子剑[1] 杜舒明[1] 

机构地区：[1]南京电子技术研究所,江苏省南京市210013

出　　处：《电子工程师》2008年第3期12-14,共3页Electronic Engineer

摘　　要：为了解决带DSP(数字信号处理器)芯片数字电路板中部分非边界扫描器件的功能测试难题,采用了边界扫描测试技术与传统的外部输入矢量测试相结合的方法,对一块带有DSP芯片数字电路板中的非边界扫描器件进行了功能测试。测试结果表明,该测试方法能够对这部分器件进行有效的故障检测和故障隔离,并可将故障隔离到芯片。充分说明这种应用边界扫描技术与传统测试方法相结合的功能测试方法能够有效地解决带DSP芯片数字电路板中部分非边界扫描器件的功能测试问题。A method integrating boundary scan and traditional vector inputting technique is introduced to test the non-boundary-scan devices in digital circuit board with DSP chips in the paper. The results of function tests to such device indicate that faults can be effectively detected and isolated to chip level using this method. The results prove that using the method integrating boundary scan and traditional vector inputting technique can effectively solve the problems of function test of partial non-boundary-scan devices in PCB with DSP chips.

关 键 词：数字电路板测试 边界扫描 故障隔离 

分 类 号：TM930.12[电气工程—电力电子与电力传动]