薄膜X射线测厚仪的研制  

Development of X-ray thickness gauge for plastic film

作　　者：靳其兵[1] 陈拉[1] 

机构地区：[1]北京化工大学自动化研究所,北京100029

出　　处：《核电子学与探测技术》2007年第6期1027-1029,共3页Nuclear Electronics & Detection Technology

摘　　要：介绍了用于薄膜测厚的全自动往复式X射线测厚仪的研制,详述了该测厚仪的硬件组成和测厚的工作原理。该装置已成功运行在双向拉伸聚丙烯(BOPP)薄膜生产线上。X-ray thickness gauge developed for plastic film is described including its working principle and hardware system. The equipment has been used successfully on BOPP.

关 键 词：测厚仪 X射线 薄膜 

分 类 号：TP274[自动化与计算机技术—检测技术与自动化装置]