半导体集成电路检验中结构相似性的运用  

Discussion on the Application of Structural Similarity to Semiconductor Integrated Circuits Test

作　　者：袁晓岚[1] 于慧[1] 康蜜[1] 

机构地区：[1]中国电子科技集团公司第四十七研究所

出　　处：《信息技术与标准化》2008年第1期18-20,共3页Information Technology & Standardization

摘　　要：介绍了结构相似性的含义和特点以及如何在半导体集成电路检验中合理地运用结构相似性程序,包括其运用方法、判别规则和注意事项等,从而提高检验效率,降低检验成本。This paper describes the signification and the characteristic of structural similarity simply, and how to apply reasonably the structural similarity to military semiconductor integrated circuits test, including the means distinguishing rule and notice proceeding. By the structural similarity process, test efficiency can be improved and test cost can be reduced

关 键 词：结构相似性 半导体集成电路 检验 

分 类 号：TN432[电子电信—微电子学与固体电子学]