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作 者:胡岚[1] 张皋[1] 高朗华[1] 王婧娜[1] 郭三民[1]
出 处:《分析测试技术与仪器》2008年第1期46-49,共4页Analysis and Testing Technology and Instruments
摘 要:报道了一种准确度高、分析步骤简单的锡酸铅TDI还原型催化剂中锡和铅含量的X射线荧光光谱方法(XRF).设计制备了标准样品,研究了仪器测试条件下元素峰位的选择和背景扣除方法.结果表明:X荧光光谱法在不破坏样品的前提下完成对二氧化锡和铅含量的同时测定,重复实验10次,Pb实验相对标准偏差为0.37%;SnO2实验相对标准偏差0.61%.A new method for determination of tin and lead content in TDI-reduction catalyzer by XRF was developed and evaluated. We prepared for standard sample, made the choice of peak on different working conditions, and the method of deducting background. It is concluded that XRF could determine SnO2 and Pb content simultaneously while the sample was scatheless. Under the best working condition, 10 times determination was done, The result is that the relative standard deviations of Pb is 0.37%, and SnO2 is 0. 61%.
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