手持设备电源芯片的自动测试方案设计  

Power Chip Auto-Test Scheme Design Based on Portable Devices

作　　者：于天国[1] 田晓明[1] 徐臻峰[1] 张萌[1] 

机构地区：[1]东南大学电子工程系国家专用集成电路系统工程中心,南京210096

出　　处：《电子器件》2008年第2期457-460,共4页Chinese Journal of Electron Devices

摘　　要：为提高手持设备电源芯片的选型效率,提出了适合电源芯片的自动测试方案。通过分析手持设备各路电压的负载需求,筛选出电源芯片的测试项目;在分析传统电源芯片测试电路后,给出了软件和硬件电路的示意设计。基于LabVIEW平台,提出了同步数据采集、触发和存储功能的实现方案。AMC3100芯片的测试数据表明,既保证测试精度,测试效率又大幅提高。To improve choose efficiency of power chip on portable devices, an auto-test scheme was presented. Based on the current demand of branch circuit, some effective test items on power chip first were chosen. After analyzing the traditional power chip test circuit, the hardware scheme and software scheme has been designed. Combined with the software of LabVIEW ; the scheme of synchronous data acquisition, trigger function and data store has also been designed. It can be seen from AMC3100 test data that autotest scheme not only guarantee the accuracy test but also greatly improve test efficiency.

关 键 词：电源 自动测试 LABVIEW 数据采集 

分 类 号：TP206.1[自动化与计算机技术—检测技术与自动化装置]