一种新的微光像增强器综合测试系统  

A NEW COMPREHENSIVE TEST SYSTFM FOR LOW-LIGHT-LEVEL LMAGE INTENSIFIERS

作　　者：刘宇[1] 马月琴[1] 姜均炎[1] 史继芳[1] 

机构地区：[1]西安应用光学研究,西安710065

出　　处：《应用光学》1997年第3期17-22,共6页Journal of Applied Optics

摘　　要：描述一种具有单一光源的激光像增强器综合测量系统。系统可以测试微光像增强器光量子类的阴极光灵敏度、辐射灵敏度、亮度增益、等效背景照度、输出信噪比、亮度均匀性和几何类的分辨率、畸变、图像同轴性、中心放大率等指标。系统对各个指标测量的不确定度优于5％。A comprehensive test system with unitary light source is described. The sysrem can test the light quantum parameters, such as photocathode sensitivity (luminous sensitivity and radiant sensitivities), luminance sam, equivalent background input, sisnal-to-noise ratio and output brightness uniformity, and geometry parameters, such as resolution, distortion, image alignment and magnification. The measuring uncertainty of the parameters is better than 5%.

关 键 词：像增强器 综合测试 色温转换 微光技术 

分 类 号：TN223.06[电子电信—物理电子学]