氩原子近LⅡ,Ⅲ边结构和振子强度密度  

STRUCTURE AND OSCILLATOR STRENGTH DENSITIES NEAR L Ⅱ,Ⅲ EDGES OF ARGON

作　　者：凤任飞[1] 武淑兰[1] 刘颖辉 暨青 徐克尊[1] 

机构地区：[1]中国科学技术大学近代物理系

出　　处：《物理学报》1997年第10期1901-1905,共5页Acta Physica Sinica

基　　金：国家自然科学基金;"八五"攀登计划;中国科学技术大学青年基金

摘　　要：在入射电子能量２５００ｅＶ，平均散射角为０°的条件下测量了氩原子内壳层２ｐ电子激发和电离的高分辨电子能量损失谱，确定了分立态的有效量子数和电离边的能量．同时确定了两组分立跃迁和电离连续区的振子强度密度．The high resolution fast electron energy loss spectrum for inner shell 2p electron excitation and ionization of argon has been measured in present work at an electron impact energy of 2500eV and a mean scattering angle of 0°. The ionization limits and effective quantum numbers have been deduced. The oscillator strength densities for discrete transitions and two ionization continua were also determined.

关 键 词：氩原子 内壳层 振子强度密度 激发能谱 

分 类 号：O562.1[理学—原子与分子物理]