光电探测器直线性检测及数据处理  

LINEARITY MEASUREMENT OF PHOTODETECTORS AND DATA PROCESSING TECHNIQUES

作　　者：张慷[1] 陈进榜[1] 

机构地区：[1]南京理工大学电光学院431教研室,南京210094

出　　处：《光子学报》1997年第8期758-764,共7页Acta Photonica Sinica

摘　　要：本文介绍了利用汉光阑法测量半导体光电探测器直线性的方法、装置，并着重介绍了用于抑制光源功率波动影响的数据处理技术和用于参考．点选择的数据处理方法．这些技术有效地提高了系统的测量重复性和准确度．Dual-aperture method and test equipment used in linearity measurement of semiconductorphotodetectors are introduced in this paper. Data processing technique which can eliminate theinfluence of power fluctuation of the light source, as well as data processing technique relating toreference point selection,are discussed in detail. These techniques have improved the repeatationand accuracy of the results.

关 键 词：半导体探测器 光电探测器 直线性 光辐射计 

分 类 号：TN206[电子电信—物理电子学] TH89[机械工程—仪器科学与技术]