复杂装备系统级测试性指标确定方法研究  

Research on Deciding Testability Figures of Complicated Equipment

作　　者：吕晓明[1] 黄考利[1] 连光耀[1] 张建茂[1] 

机构地区：[1]石家庄军械工程学院,河北石家庄050003

出　　处：《计算机测量与控制》2008年第3期357-359,362,共4页Computer Measurement &Control

摘　　要：通过综合权衡系统可用度和装备全寿命周期费用这两方面因素,以系统可用度最大、装备全寿命周期费用最小为评价目标来确定复杂装备系统级测试性指标;建立了系统可用度和装备全寿命周期费用的数学模型,并通过合理的假设,将双函数的最值优化问题转化为在不等式约束条件下的单函数最值优化问题,最终得到了确定系统级测试性指标的数学模型;最后,通过一个实例,采用遗传算法并借助MATLAB软件平台完成了对数学模型的求解,验证了该方法的可行性。By weighing synthetically the two factors which are testability of system and life-circle cost of equipment,we determine the system level testability index of complicated equipment is determined on the basis of maximum availability and minimum life-circle cost.We construct the mathematical model of system availability and life-circle cost and change the optimizing problem of double-function to the optimizing problem of single-function under inequality constraints condition by appropriate assumption,then we get the final model of determining the system level testability index.Finally,we verify the feasibility of this method by adopting Genetic Algorithms to solve the model under the software platform of MATLAB.

关 键 词：可用度 全寿命周期费用 测试性指标 遗传算法 MATLAB 

分 类 号：TP23[自动化与计算机技术—检测技术与自动化装置]