绝缘老化试验用钨针尖电极的制备  

Preparation of the Tungsten Pin Electrode Using in the Insulating Aging Test

作　　者：刘洋[1] 杨春[1] 

机构地区：[1]哈尔滨理工大学电气与电子工程学院,哈尔滨150040

出　　处：《黑龙江水专学报》2008年第1期110-111,共2页Journal of Heilongjiang Hydraulic Engineering College

摘　　要：设计了一套采用检测电流变化率对制作绝缘老化试验用钨针尖电极进行控制的试验装置,使切断电流的时间控制在ms级以下,制作出半径在μm级的分散性较小的钨针尖电极,并进一步对试验参数(如:钨丝直径,阴极孔径大小等)对试验结果的影响进行了分析。分析和实验表明,本方法制备时间短,脱离速度快,实验效果良好。A set of the test equipment is designed, which makes the tungsten pin electrode using the ratio of the current change, and cutting off time is limited below millisecond. The radius of the tungsten pin electrode is made below micrometer and has lesser dispersibility. The effects of the test parameters on the resuits are analyzed such as the diameter of the tungsten filament, the aperture of the cathode and so on. It is proofed that the time of the preparation is short, the escape velocity is speedy and the resuh is good

关 键 词：电化学腐蚀 钨针尖 电流变化率 

分 类 号：TM851[电气工程—高电压与绝缘技术]