50GHz宽带采样电路的SPICE仿真建模  

The Development of the 50GHz Sampling Circuit SPICE Convergence Model

作　　者：张喆[1] 林茂六[1] 徐清华[1] 谭久彬[1] 

机构地区：[1]哈尔滨工业大学电子与通信工程系342信箱,黑龙江哈尔滨150001

出　　处：《电子学报》2008年第3期599-603,共5页Acta Electronica Sinica

基　　金：国家自然科学基金(No.60772078);教育部博士点基金资助(No.20070213026);哈工大优秀青年教师培养计划(No.HITQNJS.2007.006)

摘　　要：本文首先提出了一个在NTN(Nose-to-Nose)校准中实际应用的50GHz宽带采样电路的SPICE默认仿真模型;然后通过设计采样电路的模型参数,使仿真的NTN冲击响应与实际测量重构的50GHz宽带采样示波器冲击相应波形基本相似.当仿真结果和测量结果近似时,可以通过仿真试验估计出采样电路对相位误差的影响,这和实际的物理采样电路对相位误差的影响是相同的,而该误差的影响却无法用实际测量实验确定;最后研究其收敛特性从而确定正确的仿真条件,目的是确保在较宽的元件参数取值范围内,该SPICE仿真模型对参数研究具有足够的鲁棒性.We simulate the behavior of real 50GHz samplers used in nose-to-nose（NTN） calibrations by developing a “de- fault” SPICE model of the sampling circuit. The NTN simulated impulse response compares well to measurements through designing the parmeters of the model. When our simulated results are similar to measured results, we can estimate of the contribution of the sampling circuitry to the phase error of physical samplers which can not be qualified in the practical measurement. In the end, we study convergence to determine the range of valid simulation conditions for this particular mode that is robust enough to accurately perform numerical experiments for a broad range of parametric studies.

关 键 词：宽带采样电路 SPICE仿真 收敛 

分 类 号：TB973[一般工业技术—计量学]