对某电子设备电磁耦合效应的实验分析  

Experimental Analysis on Electromagnetic Coupling Effect of One Electronic Equipment

作　　者：谢鹏浩[1] 谭志良[1] 张荣奇[1] 

机构地区：[1]军械工程学院弹药工程系,河北石家庄050003

出　　处：《军械工程学院学报》2008年第1期40-43,共4页Journal of Ordnance Engineering College

摘　　要：利用电磁仿真软件FEKO建立了设备模型和所需的电磁场环境，对某型电子设备的电磁耦合规律进行仿真实验，并依此参考进行了实地测试。实验数据表明：频率在400MHz以上时设备内部准中心位置有中心聚集效应和明显的窗口耦合，内部设备附近产生强耦合场；开门破坏了设备内部谐振腔，造成内部谐振场强幅度变小，电源线接口处电场强度较高，电磁能量易被耦合入电源系统，需要采取保护措施。仿真结果为实际试验和具有类似尺寸孔隙的设备提供了参考。In order to study the electromagnetic coupling law of electronic equipment, software FEKO was used to set up the equipment model and typical electromagnetic field environments. The simulating experiment was conducted, on whose base testing was made. Data show： centre gathering and obvious window coupling presented around the centre position of the equipment above 400 MHz, with strong coupling field existing near the inside equipment; opening the door destroyed the resonant cavity within the equipment, caused the inside field intensity to diminish; the relatively higher electric field intensity happens near the power cable, and electromagnetic energy is apt to enter the power system, which needed protection. The simulation result offered reference for testing and equipment with holes of similar size.

关 键 词：FEKO 孔缝 电磁耦合 电子设备 

分 类 号：O441.5[理学—电磁学] TP339[理学—物理]