用于Z箍缩X辐射谱诊断的柱面凸晶摄谱仪的性能分析  

Performance of a cylindrical curved convex crystal spectrograph for wire array Z-pinch experiments

作　　者：叶凡[1] 郭存[2] 李正宏[2] 杨建伦[2] 徐荣昆[2] 秦义[2] 薛飞彪[2] 

机构地区：[1]清华大学工程物理系,北京100084 [2]中国工程物理研究院核物理与化学研究所,四川绵阳621900

出　　处：《强激光与粒子束》2008年第3期383-386,共4页High Power Laser and Particle Beams

基　　金：国家自然科学基金重点资助课题(10035030)

摘　　要：考虑X光源的空间尺寸和晶体的摇摆曲线,用光线追迹方法计算了诊断丝阵Z箍缩等离子体X辐射谱的柱面凸晶摄谱仪的色散、能谱分辨和空间分辨以及系统参数对它们的影响。结果表明:决定柱面凸晶摄谱仪能谱分辨的主要因素是光源尺寸以及光源-晶体之间距离;增大光源-晶体之间距离能够改善能谱分辨,但导致径向空间分辨能力下降。并依此建立了云母晶体摄谱仪,在"强光一号"装置上对系统进行了测试,获得时间积分铝丝阵负载Z箍缩等离子体X辐射谱。X-ray spectrograph with a cylindrical curved convex crystal was designed for wire array Z-pinch experiments. Taking into consideration the effect of X-ray source size and rocking curve of crystal, ray tracing techniques were used for exploring the dispersion, spectral resolution, spatial resolution and their dependences on parameters of the spectrograph. The results show that size of X-ray source and its distance to the crystal influence spectral resolutions more than the other parameters. Increasing this distance improves the spectral resolution, but worsens spatial resolving power. A mica crystal spectrograph was then tested successfully on “Qiangguang-Ⅰ” pulsed power facility. Time integrated X-ray spectrographs of aluminum wire array Z-pinch plasmas were recorded.

关 键 词：丝阵Z箍缩 X辐射谱 柱面凸晶摄谱仪 光线追迹 

分 类 号：O536[理学—等离子体物理] N37[理学—物理]