LXI仪器技术研究和应用中有关问题的认识  

Research on Instrument Technology and Correlative Problems of LXI

作　　者：赵建[1] 吴树奎[1] 张瑞忠[1] 

机构地区：[1]西安电子科技大学机电工程学院,陕西西安710071

出　　处：《仪表技术》2008年第4期51-53,共3页Instrumentation Technology

摘　　要：介绍LXI仪器技术的新发展与新变化。从应用的角度说明了LXI仪器技术的局限性,着重阐述了LXI在实际应用设计和开发当中的关键性技术问题,并针对目前存在的LXI仪器系统集成技术的相关问题,提出了新的见解。最后分析了国内LXI仪器系统集成技术的发展的必要性和紧迫性。LXI is the next generation bus for testing instrument, which makes a motivation to accelerate progress of instrument technology. Firstly, new development and new changes of LXI are presented. From applied point of view, the localization of LXI is discussed. Then the problems that LXI meets in application and design are expatiated, new views on present problems of LXI integration technology are proposed and the importance of LXI instrument system integration technology is discussed.

关 键 词：LXI 仪器技术 系统研究 

分 类 号：TP39[自动化与计算机技术—计算机应用技术]