检索规则说明:AND代表“并且”;OR代表“或者”;NOT代表“不包含”;(注意必须大写,运算符两边需空一格)
检 索 范 例 :范例一: (K=图书馆学 OR K=情报学) AND A=范并思 范例二:J=计算机应用与软件 AND (U=C++ OR U=Basic) NOT M=Visual
机构地区:[1]Shanghai Institute of Optics and Fine Mechanics Chinese Academy of Sciences,Shanghai 201800
出 处:《Chinese Optics Letters》2008年第4期294-296,共3页中国光学快报(英文版)
基 金:the National Natural Science Foundation of China under Grant No.50672108 and 60644002.
摘 要:BiOx films are prepared by reactive direct current (DC) magnetron sputtering from a metallic bismuth target in Ar +O2 with different O2/Ar ratios. It is found that the optical property of BiOx films is sensitive to O2/Ar ratios and the films deposited at O2/Ar ratio of 0.5 have the best reflectivity contrast under the same conditions. The structure and optical characteristics of the films are studied by X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), and spectrophotometer. As revealed by investigations, the phase transition is mainly responsible for the change of optical properties. The static test results indicate that the BiO~ films have good writing sensitivity for blue laser beams. A high reflectivity contrast of about 52% at a writing power of 11 mW and writing pulse width of 800 ns is obtained. In addition, the films demonstrate good stability after being read for 10000 times.BiOx films are prepared by reactive direct current (DC) magnetron sputtering from a metallic bismuth target in Ar +O2 with different O2/Ar ratios. It is found that the optical property of BiOx films is sensitive to O2/Ar ratios and the films deposited at O2/Ar ratio of 0.5 have the best reflectivity contrast under the same conditions. The structure and optical characteristics of the films are studied by X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), and spectrophotometer. As revealed by investigations, the phase transition is mainly responsible for the change of optical properties. The static test results indicate that the BiO~ films have good writing sensitivity for blue laser beams. A high reflectivity contrast of about 52% at a writing power of 11 mW and writing pulse width of 800 ns is obtained. In addition, the films demonstrate good stability after being read for 10000 times.
关 键 词:Bismuth compounds Laser beams Laser recording Light reflection Magnetron sputtering Optical data storage Optical properties Phase transitions SPECTROPHOTOMETERS Thin films X ray diffraction analysis X ray photoelectron spectroscopy
分 类 号:TN244[电子电信—物理电子学]
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在链接到云南高校图书馆文献保障联盟下载...
云南高校图书馆联盟文献共享服务平台 版权所有©
您的IP:216.73.216.36