用剪切散斑的载波法实现对物体微小形变的快速检测  

Detection tiny deformation by carrier method in shearing speckle pattern interferometry

作　　者：陈丽[1] 孙志兵[1] 郑柱[1] 

机构地区：[1]广东工业大学物理与光电工程学院,广州510006

出　　处：《激光杂志》2008年第2期40-41,共2页Laser Journal

摘　　要：根据剪切散斑干涉条纹为离面位移对剪切方向导数的等值线的关系,本文将剪切散斑的空间载波法与对理论离面位移的求导相结合,对标准试件进行检测,通过将实验值与理论值相比较,验证了在工程现场检测中空间载波法能应用于精度要求不高的场合。According to the relationship between the electronic sheafing speckle pattern intefferometry and the derivation of out - of- plane to one direction, the samples were detected by the carrier method of shearing speckle pattern combined with the derivation of the theoretical equation in the paper. Comparing the value getting from experiment with theoretical value, it indicated that the carrier wave method can be used in practical inspection where it needs less precision.

关 键 词：剪切散斑 载波 形变 位移梯度 干涉条纹 

分 类 号：TN247[电子电信—物理电子学]