基于噪声奇异性的光耦器件爆裂噪声检测新法  被引量:3

New Checking Method of Optocoupler Burst Noise Based on Singularity of Noise

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作  者:谢端[1] 赵健[2] 王党会[3] 郭秀梅[2] 

机构地区:[1]西安邮电学院计算机科学与技术系,西安710121 [2]西北大学信息科学与技术学院,西安710069 [3]西安石油大学材料科学与工程学院,西安710065

出  处:《半导体技术》2008年第5期404-408,共5页Semiconductor Technology

基  金:陕西省自然科学基金资助项目(2006F42,2007F38);中国博士后科学基金资助项目(20060401007)

摘  要:为了准确客观地检测出爆裂噪声的存在,提出了基于噪声信号奇异性的光耦器件爆裂噪声检测方法。通过对光耦器件噪声样本的计算发现,含有大量爆裂噪声的样本,其平均Hlder指数接近于0,反映到局部奇异性指数分布直方图中,其最可几率所对应的h值也在0值附近。而不含爆裂噪声的样本平均Hlder指数则在-0·3附近。实验证实了奇异性检测方法可以明晰地区分良品组与次品组光耦器件。噪声奇异性参数可以作为爆裂噪声是否存在的客观依据。a new method In order to detect the presence of burst noise in optocoupler device accurately and objectively, was put forward based on singularity of noise. Through estimating singularity of optocoupler noise samples, it was found that the mean Hoelder exponent in the samples containing a great deal of burst noise was near zero and the high probability corresponding in the local singulari without burst noise. to Hoelder exponent ( h value) was also around zero ty distribution histogram, but the mean Hoelder exponent was around -0.3 in samples The experiment proves that the new method can distinguish fine devices from inferiors perspicuously. Singularity parameters can be an object foundation for checking out burst noise

关 键 词:光耦器件 爆裂噪声 光耦噪声筛选 噪声奇异性 

分 类 号:TN306[电子电信—物理电子学] TN36

 

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