Preparation and characterization of 3-mercaptopropyl trimethoxysilane self-assembled monolayers  

作　　者：Tao Bai Xianhua Cheng 

机构地区：[1]School of Mechanical Engineering, Shanghai Jiaotong University, Shanghai 200030, China [2]National Engineering Research Center for Nanotechnology, Shanghai 200237, China

出　　处：《Journal of University of Science and Technology Beijing》2008年第2期192-196,共5页北京科技大学学报（英文版）

基　　金：This work was financially supported by the National Natural Science Foundation of China (No.50475023);the Nano Foundation of Shanghai Technology Committee (No.0252nm014);the State Key Laboratory Fund (No.0102) in State Key Laboratory for Solid Lubrication, Lanzhou Institute of Chemical Physics, Chinese Academy of Science

摘　　要：Silane coupling regent （3-mercaptopropyl trimethoxysilane （MPTS）） was prepared on the single-crystal silicon substrate to form 2-dimensional self-assembled monolayers （SAMs）. The growth behavior of SAMs formed from 3-MPTS was investigated using atomic force microscopy （AFM）, contact angle measurements, ellipsometry, and X-ray photoelectron spectroscopy （XPS）. The formation behavior of MPTS SAMs was investigated by a series of AFM images and the roughness of MPTS SAMs on silicon substrates with the assembling time from 1 min to 24 h. The water contact angle measurements indicated the growth behavior of MPTS that correlated with the AFM measurements at different immersion times, too. The chemical states of the typical elements in the MPTS SAMs were analyzed using X-ray photoelectron spectroscopy. The results show that MPTS is self-assembled on the substrate.Silane coupling regent （3-mercaptopropyl trimethoxysilane （MPTS）） was prepared on the single-crystal silicon substrate to form 2-dimensional self-assembled monolayers （SAMs）. The growth behavior of SAMs formed from 3-MPTS was investigated using atomic force microscopy （AFM）, contact angle measurements, ellipsometry, and X-ray photoelectron spectroscopy （XPS）. The formation behavior of MPTS SAMs was investigated by a series of AFM images and the roughness of MPTS SAMs on silicon substrates with the assembling time from 1 min to 24 h. The water contact angle measurements indicated the growth behavior of MPTS that correlated with the AFM measurements at different immersion times, too. The chemical states of the typical elements in the MPTS SAMs were analyzed using X-ray photoelectron spectroscopy. The results show that MPTS is self-assembled on the substrate.

关 键 词：mercaptopropyl trimethoxysilane （MPTS） thin films SELF-ASSEMBLY CHARACTERIZATION atomic force microscopy （AFM） 

分 类 号：O484[理学—固体物理]